본문으로 바로가기

Patents

Electromagnetic Wave Metrology Group

글자 크게 글자 작게 인쇄
특허 목록을 담은 표로, 번호, 특허명, 출원자, 국가, 출원일 항목으로 구성되어 있습니다.
No Name of Patent Application Date
10-2735708 APPARATUS AND METHOD FOR SHIELDING EFFECTIVENESS BASED ON ELECTRO-OPTIC SENSORS 2024-11-25
10-2726843 STACKED FFILTER AND FABRICATION METHOD THEREOF 2024-11-01
10-2592534 METHOD FOR CORRECTING MEASUREMENT ERROR FOR S-PARAMETER 2023-10-18
10-2532758 Design method and storage medium storing computer programs for frequency selective surface filters 2023-05-10
10-2451464 ELECTROMAGNETIC WAVE PROBE AND ELECTROMAGNETIC WAVE DETECTING APPARATUS USING THE SAME 2022-09-30
10-2363140 Design method and storage medium storing computer programs for frequency selective surface filters 2022-02-10
109804256 ELECTROMAGNETIC IMPEDANCE MEASUREMENT DEVICE AND ELECTROMAGNETIC IMPEDANCE CALIBRATION METHOD 2021-03-16
10802064 ELECTROMAGNETIC WAVE IMPEDANCE MEASURING APPARATUS AND CALIBRATION METHOD OF IMPEDANCE 2020-10-13
10145876 ELECTROMAGNETIC WAVE POWER SENSING APPARATUS AND SYSTEM COMPRISING THEREOF 2018-12-04
105676003 ELECTROMAGNETIC WAVE POWER SENSING APPARATUS AND SYSTEM COMPRISING THEREOF 2018-09-28
10-1852484 Electromagnetic Wave Impedance Measuring Apparatus and Calibration Method of Impedance 2018-04-20
10-1707632 Non Destructive Detection Methods of Crack using Electromagnetic Waves 2017-02-10
10-1700875 ELECTORMAGNETIC WAVE POWER SENSING APPARATUS AND SYSTEM COMPRISING THEREOF 2017-01-23
10-1659402 The calibration method for high speed digitizer with time interleaving ADCs 2016-09-19
10-1502557 Material measurement apparatus with variable coaxial impedance structures 2015-03-09
QUICK MENU

QUICK MENU 원하시는 서비스를 클릭하세요!

등록된 퀵메뉴가 없습니다.

등록된 배너가 없습니다.