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Patents

Electromagnetic Wave Metrology Group

글자 크게 글자 작게 인쇄
특허 목록을 담은 표로, 번호, 특허명, 출원자, 국가, 출원일 항목으로 구성되어 있습니다.
No Name of Patent Application Date
10-2451464 ELECTROMAGNETIC WAVE PROBE AND ELECTROMAGNETIC WAVE DETECTING APPARATUS USING THE SAME 2022-09-30
10-2363140 Design method and storage medium storing computer programs for frequency selective surface filters 2022-02-10
109804256 ELECTROMAGNETIC IMPEDANCE MEASUREMENT DEVICE AND ELECTROMAGNETIC IMPEDANCE CALIBRATION METHOD 2021-03-16
10802064 ELECTROMAGNETIC WAVE IMPEDANCE MEASURING APPARATUS AND CALIBRATION METHOD OF IMPEDANCE 2020-10-13
10145876 ELECTROMAGNETIC WAVE POWER SENSING APPARATUS AND SYSTEM COMPRISING THEREOF 2018-12-04
105676003 ELECTROMAGNETIC WAVE POWER SENSING APPARATUS AND SYSTEM COMPRISING THEREOF 2018-09-28
10-1852484 Electromagnetic Wave Impedance Measuring Apparatus and Calibration Method of Impedance 2018-04-20
10-1707632 Non Destructive Detection Methods of Crack using Electromagnetic Waves 2017-02-10
10-1700875 ELECTORMAGNETIC WAVE POWER SENSING APPARATUS AND SYSTEM COMPRISING THEREOF 2017-01-23
10-1659402 The calibration method for high speed digitizer with time interleaving ADCs 2016-09-19
10-1502557 Material measurement apparatus with variable coaxial impedance structures 2015-03-09
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