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특허 목록을 담은 표로, 번호, 특허명, 출원자, 국가, 출원일 항목으로 구성되어 있습니다.
No Name of Patent Application Date
786825 Apparatus and Method for High-Accuracy Optical Particle Measuring using Laser Power Scanning 2022-12-22
11493433 NORMAL INCIDENCE ELLIPSOMETER AND METHOD FOR MEASURING OPTICAL PROPERTIES OF SAMPLE BY USING SAME 2022-11-08
10-2357344 Portable hydrogen fuel quality analysis apparatus for hydrogen station 2022-01-25
6950101 FLEXIBLE DOUBLE-JUNCTION SOLAR CELL 2021-09-27
3336058 LATERAL P-N JUNCTION BLACK PHOSPHORUS THIN FILM, AND METHOD OF MANUFACTURING THE SAME 2021-08-11
10-2282443 The Energy Level Characterization Method Of Core/Shell Nano Particle 2021-07-21
10-2233811 Organic thin film transistor and method for manufacturing same 2021-03-24
10957808 FLEXIBLE DOUBLE-JUNCTION SOLAR CELL 2021-03-23
10-2227433 Apparatus and Method for High-Accuracy Optical Particle Measuring using Laser Power Scanning 2021-03-08
10879476 ORGANIC THIN FILM TRANSISTOR AND METHOD OF MANUFACTURING THE SAME 2020-12-29
10811551 TANDEM SOLAR CELL INCLUDING METAL DISK ARRAY 2020-10-20
6780023 TANDEM SOLAR CELL INCLUDING METAL DISK ARRAY 2020-10-16
10-2139988 Normal-incidence ellipsometer and method for measuring optical properties of the sample using the same 2020-07-27
10-2139995 Normal-incidence and non-normal-incidence combination ellipsometer and method for measuring optical properties of the sample using the same 2020-07-27
10-2127636 Infrared Light Emitting Diode And Infrared Gas Sensor 2020-06-23
10-2119757 Multi-layered resistive-thermocouple type temperature measuring wafer sensor and method for fabricating the same 2020-06-01
10468604 LATERAL P-N JUNCTION BLACK PHOSPHORUS THIN FILM, AND METHOD OF MANUFACTURING THE SAME 2019-11-05
107429990 CHROMATIC ABERRATION-FREE OPTICAL ELEMENT-ROTATION TYPE ELLIPSOMETER AND METHOD OF MEASURING MUELLER-MATRIX OF SPECIMEN USING SAME 2019-10-15
10-2004040 TERAHERTZ PROBE WAVEGUIDE FOR CANCER SURGERY 2019-07-19
10317334 Achromatic rotating-element ellipsometer and method for measuring mueller-matrix elements of sample using the same 2019-06-11
10-1980149 OPTICAL REMOTE SENSING FOR MONITORING HAZARDOUS AIR POLLUTANTS IN THE ATMOSPHERE 2019-05-14
10-1957801 Flexible Double Junction Solar Cell Device 2019-03-07
10-1941923 Lateral p-n junction black phosphorus film, and method of manufacturing the same 2019-01-18
10145785 OPTICAL ELEMENT ROTATION TYPE MUELLER-MATRIX ELLIPSOMETER AND METHOD FOR MEASURING MUELLER-MATRIX OF SAMPLE USING THE SAME 2018-12-04
10-1918602 Infrared Light Emitting Diode And Infrared Gas Sensor 2018-11-08
10121658 Method of fabricating black phosphorus ultrathin film and black phosphorus ultrathin film thereof 2018-11-06
10-1907890 CRDS design method using mode matching and time-resolved coupling efficiency 2018-10-08
10082468 Method for evaluating SERS sensor substrate 2018-09-25
10062799 Quantum-dot photoactive-layer and method for manufacture thereof 2018-08-28
10-1890404 Method, apparatus and container for cell-type gas CRM(Certified Reference Material) 2018-08-14
105492889 The Muller matrix ellipsometer test of optical element rotation type and the method for using the Muller matrix of its measurement sample 2018-06-08
10-1783971 The Tandem Solar Cell With The Metal Disk Array 2017-09-26
10-1756325 Planar Type Plasma Diagnosis Apparatus 2017-07-04
9581498 ROTATING-ELEMENT SPECTROSCOPIC ELLIPSOMETER AND METHOD FOR MEASUREMENT PRECISION PREDICTION OF ROTATING-ELEMENT SPECTROSCOPIC ELLIPSOMETER, AND RECORDING MEDIUM STORING PROGRAM FOR EXECUTING THE SAME, AND RECORDING MEDIUM STORING PROGRAM FOR EXECUTING THE SAME 2017-02-28
10-1698022 Achromatic rotating-element ellipsometer and method for measuring Mueller-matirx elements of the sample using the same 2017-01-13
10-1624489 IR Photo-detector using a metamaterial based on an antireflection coating to match the impedance between air and SP resonator 2016-05-20
10-1624487 Antireflection coating layered plasmonic infrared device 2016-05-20
10-1590389 Simulation for Evaluating Ellipsometric Data Uncertainties of Multichannel Rotating-Element Spectroscopic Ellipsometers 2016-01-26
10-1576573 Black phosphorous thinning 2015-12-04
10-1509054 Rotating-Element Ellipsometer and method for measuring Mueller-matirx elements of the sample using the same 2015-03-31
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