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Patents

특허 목록을 담은 표로, 번호, 특허명, 출원자, 국가, 출원일 항목으로 구성되어 있습니다.
No Name of Patent Application Date
10-2447267 Vertical -plasma processing system for complex measuring of contamination particles 2022-09-21
10-2230740 Apparatus for in-situ evaluating material characteristics 2021-03-16
10-2229906 Process and method for hydrogen embrittlement resistive parts processed by in situ gas injection into local melting pool 2021-03-15
10-2204536 Capsule Type Viscometer, Liquid Phase Precursor Degasser and Liquid Phase Precursor Management System Including Thereof 2021-01-13
10-2204607 Liquid Phase Precursor Including Dispersion Means 2021-01-13
10-2204627 Liquid Precursor Degasser Using Centrifugal Force 2021-01-13
10-2202390 Hydrogen embrittlement resistive stainless steel agglomerated parts and powder reformed by gas treatment 2021-01-07
10-2166633 Liquid Phase Precursor Degasser Including Exposed Surface Area Increasing Means 2020-10-12
10-2155569 OLED용 재료의 장시간 열안정성 평가를 위한 열처리 장치 및 OLED용 재료의 정제 장치 2020-09-08
10-2147363 Liquid Phase Precursor Life Time Management System 2020-08-18
10-2134306 P-type thermoelectric composite and process for preparing the same 2020-07-09
10696548 SINGLE-PHASE OXIDE FOR HYDROGEN STORAGE HAVING TIO2 CRYSTAL PHASE AND METHOD OF PREPARING THE SAME 2020-06-30
10-2116854 High efficient additive manufacturing process apparatus for complex shaped hydrogen embrittlement resistive parts 2020-05-25
10-2111554 Anodizing automatic process system using electrolyte circulation 2020-05-11
10-2041127 Synthetic method of single phase oxide for hydrogen storage with TiO2 crystal phase and single phase oxide for hydrogen storage using the same 2019-10-31
10-2005728 METHOD FOR MANAFACTURING THIN FILM FORMATION USING ATOMIC LAYER DEPOSITION AND METAL OXIDE THIN FILM USING THE SAME 2019-07-25
10-1988394 Apparatus for insitu evaluating material characteristics of OLED material and thin film 2019-06-05
10-1979290 Apparatus and Method for Measuring Quantity of Heat for Natural Gas 2019-05-10
10283339 PARTICLE BEAM MASS SPECTROMETER AND PARTICLE MEASUREMENT METHOD BY MEANS OF SAME 2019-05-07
10-1957661 Apparatus and method for evaluating plasma-resistant coating parts 2019-03-07
10-1953379 Apparatus for evaluating contaminated particles of durability parts used in plasma equipment 2019-02-22
10-1909959 Accelerated test apparatus and reliability test method of the coating base materials used in plasma equipment 2018-10-15
10-1872899 Apparatus for storing material in high temperature 2018-06-25
10-1823947 Method for producing nanoparticle film 2018-01-25
10-1663740 Laser Scattering Particle Analysis Apparatus and Analysis Method Of The Same 2016-09-30
10-1643382 Apparatus and method for keeping samples used in OLEDs under high-vacuum and high-temperature 2016-07-21
10-1535747 diagnostic apparatus for a contamination of semiconductor coating equipment and the diagnostic method thereof 2015-07-03
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