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Patents

Space Metrology Group

글자 크게 글자 작게 인쇄
특허 목록을 담은 표로, 번호, 특허명, 출원자, 국가, 출원일 항목으로 구성되어 있습니다.
No Name of Patent Application Date
10-2743414 OPTICAL AXIS ALIGNMENT DEVICE FOR LASER INTERFEROMETER FOR OPTICAL FLAT MEASUREMENT 2024-12-11
10-2287242 Optical having Mirror united with Body and Manufacturing Method thereof 2021-08-02
10-2029007 Electrostatic Levitation Crystal Growth Apparatus For Solution And Electrostatic Levitation Crystal Growing Method Of The Same 2019-09-30
10233561 ELECTROSTATIC LEVITATION CRYSTAL GROWTH APPARATUS FOR SOLUTION AND CRYSTAL GROWING METHOD OF USING THE SAME 2019-03-19
10033307 SAMPLE LOADING DEVICE FOR ELECTROSTATIC LEVITATION APPARATUS 2018-07-24
10-1783541 Spectroscopy-combined local indentation system for real time observation 2017-09-25
10-1743459 Surface Finishing Treatment Tool for Variable Internal Diameter 2017-05-30
10-1622593 Electrostatic Levitation Crystal Growth Apparatus For Solution And Electrostatic Levitation Crystal Growing Method Of The Same 2016-05-13
10-1523366 Pneumatic apparatus for mirror polishing and gravity compensation 2015-05-20
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