Patents
Patents
| No | Name of Patent | Application Date |
|---|---|---|
| 10-2741984 | Reflective Fourier ptychographic microscopy using flexible LED array | 2024-12-09 |
| 11906281 | DEVICE AND METHOD FOR MEASURING THICKNESS AND REFRACTIVE INDEX OF MULTILAYER THIN FILM BY USING ANGLE-RESOLVED SPECTRAL REFLECTOMETRY | 2024-02-20 |
| 10-2628967 | Tunable Fourier ptychographic microscopy | 2024-01-19 |
| 10-2588157 | Reflective incoherent illumination microscopy with LED array | 2023-10-06 |
| 10-2526978 | System and Method for real-time 3D measurement of freeform surfaces using single diagonal fringe pattern | 2023-04-25 |
| 10-2485679 | Calibration method of deflectometry for improving measurement accuracy | 2023-01-03 |
| 10-2484108 | A Two-dimensional (2D) Angular Displacement Measuring Apparatus | 2022-12-29 |
| 10-2456440 | System for fabricating 3D diffractive optical element on curved surfaces using direct laser lithography | 2022-10-14 |
| 11466978 | APPARATUS AND METHOD FOR MEASURING THE THICKNESS AND REFRACTIVE INDEX OF MULTILAYER THIN FILMS USING NGLE - RESOLVED SPECTRAL INTERFERENCE IMAGE ACCORDING TO POLARIZATION | 2022-10-11 |
| 11486700 | SYSTEM AND METHOD FOR 3D SHAPE MEASUREMENT OF FREEFORM SURFACE BASED ON HIGH - SPEED DEFLECTOMETRY USING COMPOSITE PATTERNS | 2022-09-23 |
| 10-2391066 | Vibration insensitive interferometry for multilayer thin-film thickness profile measurement | 2022-04-22 |
| 10-2385110 | Reflective Fourier ptychographic microscopy with misalignment error correction algorithm | 2022-04-06 |
| 10-2385116 | Full-field Distortion Measurement Method of Virtual Reality/Augmented Reality Device lenses | 2022-04-06 |
| ZL201910073090.X | ABSOLUTE POSITION MEASURING METHOD, ABSOLUTE POSITION MEASURING APPARATUS, AND COLOUR SCALE | 2022-03-22 |
| 10-2366954 | System and Method for 3D measurement of freeform surfaces based on deflectometry | 2022-02-21 |
| 11243070 | Apparatus and method for multilayer thin film thickness measurement using single-shot angle-resolved spectral reflectometry | 2022-02-08 |
| 7001835 | Method and system for compensating nonlinearity response characteristics in phase-shifting deflectometry | 2021-12-28 |
| 111060003 | 3-DEGREE OF FREEDOM PLANAR ALIGNMENT APPARATUS AND AN OPERATING METHOD THEREOF | 2021-10-15 |
| 10-2315010 | Reflective Fourier ptychographic microscopy using a parabolic mirror | 2021-10-14 |
| 10-2315016 | Reflective Fourier ptychographic microscopy using segmented mirrors and a mask | 2021-10-14 |
| 111060002 | ABSOLUTE POSITION MEASURING METHOD AND ABSOLUTE POSITION MEASURING APPARATUS | 2021-08-10 |
| 10-2240190 | System and method for measuring optical characteristics of VR/AR optical components | 2021-04-08 |
| 10-2229604 | System and method for measuring Optical characteristic and Image quality of VR/AR | 2021-03-12 |
| 10-2222915 | System and method for measuring Optical characteristic and Image quality of VR/AR | 2021-02-25 |
| 10-2218015 | System for measuring Grating phase using calibration Grating in FPM | 2021-02-15 |
| 10-2205597 | Apparatus and method for multilayer thin film thickness measurement using single-shot angle-resolved spectral reflectometry | 2021-01-15 |
| 10801864 | ABSOLUTE POSITION MEASURING METHOD, ABSOLUTE POSITION MEASURING APPARATUS, AND COLOUR SCALE | 2020-10-13 |
| 10-2156431 | DISTANCE MEASUREMENT DEVICE AND OPERATING METHOD OF DISTANCE MEASUREMENT DEVICE | 2020-09-09 |
| 10-2132559 | Real-time 3D Profile Measurement of Freeform Surfaces by Lateral Shearing Interferometer using Birefrignent Materials | 2020-07-03 |
| 10-2082476 | 2D Absolute Position Measuring Method And Absolute Position Measuring Apparatus | 2020-02-21 |
| 10466031 | Method for measuring three-dimensional thickness profile of multi-layered film structure based on imaging spectrometer | 2019-11-05 |
| 10-2041890 | Absolute Position Measuring Method, Absolute Position Measuring Apparatus, and Colour Scale | 2019-11-01 |
| 10-2041881 | 3-Degree Of Freedom Planar Alignment Apparatus | 2019-11-01 |
| 10-2015216 | An apparatus and method for measuring the thickness and refractive index of multilayer thin films using angle-resolved spectral interference image according to polarization | 2019-08-21 |
| 10-2015219 | Apparatus and method for 3D measurement of freeform surfaces based on high-speed deflectometry using composite patterns | 2019-08-21 |
| 10-2004614 | APPARATUS FOR BENDING THIN MIRROR USING VACUUM ATTRACTION AND OPERATING METHOD THEREOF | 2019-07-22 |
| 10-1969642 | Multi-Joint Motion System with Measurement Using Laser Tracker Head and SMR(sphere mounted retro-reflector) and Grinding Function and Operating Method of The Same | 2019-04-10 |
| 10-1969637 | Apparatus and Method for Automatic Injection of Polishing Composition for Large Area Mirror System | 2019-04-10 |
| 10-1968916 | Flat Mirror Profile Measuring Apparatus and Method Of The Same | 2019-04-09 |
| 10-1959665 | A Gentry Type Ball Contact 3D Measuring System Having Compensating Position Algorithm, Method Thereof, Execution Program Thereof Method and Recorded Med of th Program | 2019-03-12 |
| 10-1955847 | Method and system for compensating nonlinearity response characteristics in phase-shifting deflectometry | 2019-02-28 |
| 10-1937043 | An apparatus and method for measuring the thickness and refractive index of multilayer thin films using angle-resolved spectroscopic reflectometry | 2019-01-03 |
| 10-1913948 | Position Compensation System and Method using Interferometer and Image Camera and Polishing Device | 2018-10-25 |
| 10-1913496 | Polishing tool apparatus for computer controlled optical surfacing | 2018-10-24 |
| 10-1890161 | Difference Imaging Apparatus For Inspection Of Particle Contaminants and Method of The Same | 2018-08-14 |
| 10-1886919 | Method for measuring threedimensional thickness profile of multi-layered film structure based on imaging spectrometer | 2018-08-02 |
| 10-1879641 | Turbidity Measuring Method By Using Airbone Bathymetry LIDAR Wave Form Analysis | 2018-07-12 |
| 10-1857601 | Field Standard Calibration System and Methods For Non Contact Type Water Level Gauges Based On IoT | 2018-05-08 |
| 9927224 | THICKNESS MEASURING APPARATUS AND THICKNESS MEASURING METHOD | 2018-03-27 |
| 10-1755158 | Apparatus and method for manufacturing duel line fine pattern using laser lithography | 2017-06-30 |
| 10-1748084 | Modeling of various tool influence fuctions in controlled optical surfacing | 2017-06-09 |
| 9651403 | Absolute Position Measurement Method, Absolute Position Measurement Apparatus and Scale | 2017-05-16 |
| 10-1642473 | Frequency And Intensity Modulation Laser Absorption Spectroscopy Apparatus and Method for Remote Gas Detection | 2016-07-19 |
| 10-1632269 | Frequency And Intensity Modulation Laser Absorption Spectroscopy Apparatus and The Measuring Method Of The Same | 2016-06-15 |
| 10-1596290 | Thickness Measuring Apparatus And Thickness Measuring Method | 2016-02-16 |
| 9223223 | APPARATUS FOR FORMING FINE PATTERNS CAPABLE OF SWITCHING DIRECTION OF POLARIZATION INTERFERENCE PATTERN IN LASER SCANNING METHOD AND METHOD OF FORMING FINE PATTERNS USING THE SAME | 2015-12-29 |
| 10-1554205 | Wavelength Scanning Lateral Shearing Interferometer for 3D Surface Profile Measurement of Freeform Optics | 2015-09-14 |
| 10-1515408 | AUTOMATIC ETCHING EQUIOMENT FOR LARGE MIRROR INCLUDING WEIGHT LIGHTENING PROCESSING UNIT AND METHOD FOR CONTROLLING THEREOF | 2015-04-21 |
| 10-1486271 | Methodforthree-dimensionalthicknessprofilemeasurement | 2015-01-20 |
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