Patents
| No | Name of Patent | Application Date |
|---|---|---|
| 11852581 | METHOD FOR CALIBRATING NANO MEASUREMENT SCALE AND STANDARD MATERIAL USED THEREIN | 2023-12-26 |
| 10-2602623 | Method for Manufacturing Nano-patterned Hydrogen Sensor using Indentation Lithography | 2023-11-10 |
| 10-2601670 | Tilt Stage for Atomic Force Microscope and Step Measurement Method Using The Same | 2023-11-08 |
| 10-2573861 | METHOD FOR GENERATING AND CONTROLLING OPTICAL CHARACTERISTICS OF 2D THIN FILM SEMICONDUCTOR MATERIAL IN DEFECT STRUCTURE USING OPTICAL SOLDERING | 2023-08-29 |
| 10-2504914 | Jig for Reactive Ion Etching Device Sample Holder and Nanoparticle Manufacturing Method Using Sam | 2023-03-02 |
| 10-2476418 | Glove Box with Electromagnetic Shield | 2022-12-09 |
| 10-2455004 | METHOD FOR MANUFACTURING WRINKLED GRAPHENE SUBSTRATE | 2022-10-11 |
| 10-2404158 | NANOTIP INDENTATION LITHOGRAPHY FOR FABRICATION OF PLASMONIC NANOSTRUCTURES AND PLASMONIC NANOSTRUCTURES FABRICATED BY THE SAME | 2022-05-26 |
| 10-2365983 | Method of Measuring Thickness of a Ultra-thin Film | 2022-02-17 |
| 11215450 | Method of Measuring Thickness of a Ultra-thin Film | 2022-01-04 |
| 11-2005-001585 | A METHOD FOR FABRICATING SPM CD-SPM NANONEEDLE PROBE USING ION BEAM AND SPM AND CD-SPM NANONEEDLE PROBE THEREBY | 2021-12-30 |
| 11087952 | Linear Structure For Displacement Transmission, and One-Dimensional and Three-Dimensional Micro Movement Device Using Same | 2021-08-10 |
| 10-2263564 | METHOD FOR CALIBRATING NANO MEASUREMENT SCALE AND STANDARD MATERIAL USED THEREIN | 2021-06-04 |
| 10-2263568 | ENCAPSULATED CONSTRUCTURE FOR QUANTUM RESISTANCE STANDARD | 2021-06-04 |
| 10-2094153 | Method for Forming High-k Insulating Film of MOS Transistor | 2020-03-23 |
| 10-2083239 | Measuring method of thin film thickness by secondary ion mass spectrometry | 2020-02-25 |
| 10-2083308 | Lithography Method Using Scanning Probe Microscope | 2020-02-25 |
| 10-2064748 | Sample Position Controllable External Stage System for Atomic Force Microscope and Observation Method Using the Same | 2020-01-06 |
| 10-2026665 | Sample Position Controllable External Stage System for Atomic Force Microscope and Observation Method Using the Same | 2019-09-24 |
| 10191081 | Measuring method for atomic force microscope | 2019-01-29 |
| 10-1855865 | Non-volatile memory device and methods for fabricating the same | 2018-05-02 |
| 9939461 | Head-integrated atomic force microscope and composite microscope including same | 2018-04-10 |
| 10-1787431 | Linear structure for transferring displacement and 1-dimensional and 3-dimensional fine scanner using the same | 2017-10-12 |
| 10-1703039 | Silicon Crystal with Superlattice Structure and Electronic Element Comprising the Same | 2017-01-31 |
| 10-1675489 | Atomic force microscope with integrated head and fusion microscope including the same | 2016-11-07 |
| 10-1607606 | Apparatus and method for atomic force microscope using circular dithering of the probe | 2016-03-24 |
| 9009861 | Fusion Measurement Apparatus | 2015-04-14 |
| 10-1489135 | A memory device and its operation scheme that exploits the bistable configurations of √3 x √3 surface unit cell at the boron-doped silicon (111) surface | 2015-01-26 |
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