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1 Photonic Microwave Distance Interferometry Using a Mode-Locked Laser with Systematic Error Correction 김우람,Haijin Fu,이근우,한성흠,장윤수,김승우 2020-10-29 Applied Sciences
2 A novel method for simultaneous measurement of thickness, refractive index, bow, and warp of a large silicon wafer using a spectral-domain interferometer 박정재,배재석,장윤수,진종한 2020-10-05 METROLOGIA
3 Precise thickness profile measurement insensitive to spatial and temporal temperature gradients on a large glass substrate 박정재,모리 히로키,장윤수,진종한 2020-07-10 APPLIED OPTICS
4 On-machine self-calibration of a two-dimensional stage using an absolute X-Y-Theta position sensor 김종안,김재완,강주식,이재용 2020-06-03 INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING
5 Absolute planar position and full angle orientation sensor using a two-dimensional color-coded binary scale 김종안,김재완,강주식,이재용,우제흔 2020-05-01 IEEE Transactions on Instrumentation and Measurement
6 소재 압출 방식 3D 프린팅 출력물 형상 치수 표준 확립을 위한 기초 연구 엄성훈,박정재,진종한,손용 2020-04-01 한국정밀공학회지
7 절대 거리 측정을 위한 편광 기반 이중 기준 경로 분광 간섭계의 개발 김영준,안흘비,박정재,진종한 2020-03-02 한국정밀공학회지
8 On-machine calibration of angular position and runout of a precision rotation stage using two absolute position sensors 김종안,김재완,강주식,이재용,진종한 2020-03-01 MEASUREMENT
9 Simultaneous measurement method of the physical thickness and group refractive index free from a non-measurable range 박정재,모리 히로키,진종한 2019-08-19 OPTICS EXPRESS
10 High-resolution angle sensor using multiple peak positions of a double slit interference pattern 김종안,김재완,이재용,강주식,진종한 2019-04-01 REVIEW OF SCIENTIFIC INSTRUMEMTS
11 A Review of Thickness Measurements of Thick Transparent Layers Using Optical Interferometry 박정재,김종안,안흘비,배재석,진종한 2019-03-11 INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING
12 Physical thickness and group refractive index measurement of individual layers for double-stacked microstructures using spectral-domain interferometry 박정재,배재석,김종안,진종한 2019-01-15 OPTICS COMMUNICATIONS
13 A Hybrid Non-destructive Measuring Method of Three-dimensional Profile of Through Silicon Vias for Realization of Smart Devices 안흘비,배재석,박정재,진종한 2018-12-01 SCIENTIFIC REPORTS
14 Uncertainty evaluation of thickness and warp of a silicon wafer measured by a spectrally resolved interferometer A.P. Drija,T. G. Gebr,이재용,강주식 2018-05-09 MEASUREMENT SCIENCE AND TECHNOLOGY
15 Note: An absolute X-Y-Θ position sensor using a two-dimensional phase-encoded binary scale 김종안,김재완,강주식,진종한 2018-04-12 REVIEW OF SCIENTIFIC INSTRUMEMTS
16 Interferometric profile scanning system for measuring large planar mirror surface based on single-interferogram analysis using Fourier transform method 김종안,김재완,강주식,진종한,엄태봉 2018-03-01 MEASUREMENT
17 Characterization and application of porous gold nanoparticles as 2-photon luminescence imaging agents: 20-fold brighter than gold nanorods 박주현,박지수,김수호,김세화,이태걸,이재용,위정섭 2018-02-08 Journal of Biophotonics
18 Multiplex CARS imaging with spectral notch shaped laser pulses delivered by optical fibers 오승렬,박주현,김경수,김수현,이재용 2017-12-11 OPTICS EXPRESS
19 Total physical thickness measurement of a multi-layered wafer using a spectral-domain interferometer with an optical comb 박정재,배재석,안흘비,진종한 2017-05-29 OPTICS EXPRESS
20 An interferometric system for measuring thickness of parallel glass plates without 2π ambiguity using phase analysis of quadrature Haidinger fringes 김종안,김재완,강주식,진종한,이재용 2017-05-01 REVIEW OF SCIENTIFIC INSTRUMEMTS
21 300 mm 실리콘 웨이퍼용 고속 관통전극 깊이 계측 장비 개발 홍순천,윤석민,우봉주,박정재,진종한 2017-05-01 한국정밀공학회지
22 Time-Resolved Pump?Probe Measurement of Optical Rotatory Dispersion in Chiral Metamaterial 우제흔,Boyoung Kang,Minji Gwon,Ji Hye Lee,Dong-Wook Kim,William Jo,Dong Ho Kim,Jeong Weon Wu 2017-04-27 ADVANCED OPTICAL MATERIALS
23 지형 기울기에 의한 항공 수심 라이다 수심 측정 오차 보정 심기현,우제흔,이재용,김재완 2017-03-09 한국정밀공학회지
24 Investigation of fiber Bragg grating as a spectral notch shaper for single-pulse coherent anti-Stokes Raman spectroscopy 오승렬,박주현,김경수,이은성,이재용,김수현 2017-01-15 OPTICS COMMUNICATIONS
25 Absolute distance measurement method without a non-measurable range and directional ambiguity based on the spectral-domain interferometer using the optical comb of the femtosecond pulse laser 박정재,진종한,김종안,김재완 2016-12-12 APPLIED PHYSICS LETTERS
26 Optical Fiber-Based Confocal and Interferometric System for Measuring the Depth and Diameter of Through Silicon Vias 안흘비,박정재,김종안,진종한 2016-12-01 JOURNAL OF LIGHTWAVE TECHNOLOGY
27 Report on APMP key comparison: calibration of angle standards 강주식,엄태봉 2016-09-07 METROLOGIA Tech. Suppl
28 Structure-charge transfer property relationship in self-assembled discotic liquid-crystalline donor-acceptor dyad and triad thin films 우제흔,Kwang Jin Lee,Benoit Heinrich,Stephane Mery,Frederic Fages,Loic Mager,Anthony D'Al´eo,Jeong Weon Wu,Fabrice Mathevet,Pascal Andr´,Jean-Charles Ribierre,Yiming Xiao,Eunsun Kim,Leszek Mateusz Mazur,David Kreher,Andr´e-Jean Attias,Katarzyna Matczyszyn,Marek Samoc 2016-06-06 RSC ADV
29 Electronic energy and electron transfer processes in photoexcited donor-acceptor dyad and triad molecular systems based on triphenylene and perylene diimide units 우제흔,K. J. Lee,E. Kim,A. Barsella,F. Mathevet,L. Mager,J. W. Wu,A. D’Ale´o,J.-C. Ribierre,Y. Xiao,X. Su,L. M. Mazur,A.-J. Attias,F. Fages,O. Cregut 2016-02-19 PHYSICAL CHEMISTRY CHEMICAL PHYSICS
30 Absolute angle measurement using a phase-encoded binary graduated disk 김종안,김재완,강주식,진종한,엄태봉 2016-02-15 MEASUREMENT
31 Dimensional metrology using the optical comb of a mode-locked laser 진종한 2016-02-01 MEASUREMENT SCIENCE AND TECHNOLOGY
32 Vibration-insensitive measurements of the thickness profile of large glass panels 박정재,배재석,진종한,김종안,김재완 2015-12-14 OPTICS EXPRESS
33 High-Speed Double-Slit Interferometer using a Position Sensitive Detector for In-Line Thickness Variation Measurement of Glass Panels 김종안,김재완,강주식,진종한,엄태봉 2015-08-01 INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING
34 Ultrahigh-resolution spectral domain optical coherence tomography based on a linear-wavenumber spectrometer 이상원,강희성,박주현,이태걸,이은성,이재용 2015-03-02 Journal of the Optical Society of Korea
35 An optical straightness measurement sensor for the KRISS watt balance 강주식,김종안,진종한,엄태봉,김재완 2015-02-02 MEASUREMENT
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