논문
TOP| 번호 | 논문제목 | 저자 | 게재년월 | 게재지 |
|---|---|---|---|---|
| 1 | Photonic Microwave Distance Interferometry Using a Mode-Locked Laser with Systematic Error Correction | 김우람,Haijin Fu,이근우,한성흠,장윤수,김승우 | 2020-10-29 | Applied Sciences |
| 2 | A novel method for simultaneous measurement of thickness, refractive index, bow, and warp of a large silicon wafer using a spectral-domain interferometer | 박정재,배재석,장윤수,진종한 | 2020-10-05 | METROLOGIA |
| 3 | Precise thickness profile measurement insensitive to spatial and temporal temperature gradients on a large glass substrate | 박정재,모리 히로키,장윤수,진종한 | 2020-07-10 | APPLIED OPTICS |
| 4 | On-machine self-calibration of a two-dimensional stage using an absolute X-Y-Theta position sensor | 김종안,김재완,강주식,이재용 | 2020-06-03 | INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING |
| 5 | Absolute planar position and full angle orientation sensor using a two-dimensional color-coded binary scale | 김종안,김재완,강주식,이재용,우제흔 | 2020-05-01 | IEEE Transactions on Instrumentation and Measurement |
| 6 | 소재 압출 방식 3D 프린팅 출력물 형상 치수 표준 확립을 위한 기초 연구 | 엄성훈,박정재,진종한,손용 | 2020-04-01 | 한국정밀공학회지 |
| 7 | 절대 거리 측정을 위한 편광 기반 이중 기준 경로 분광 간섭계의 개발 | 김영준,안흘비,박정재,진종한 | 2020-03-02 | 한국정밀공학회지 |
| 8 | On-machine calibration of angular position and runout of a precision rotation stage using two absolute position sensors | 김종안,김재완,강주식,이재용,진종한 | 2020-03-01 | MEASUREMENT |
| 9 | Simultaneous measurement method of the physical thickness and group refractive index free from a non-measurable range | 박정재,모리 히로키,진종한 | 2019-08-19 | OPTICS EXPRESS |
| 10 | High-resolution angle sensor using multiple peak positions of a double slit interference pattern | 김종안,김재완,이재용,강주식,진종한 | 2019-04-01 | REVIEW OF SCIENTIFIC INSTRUMEMTS |
| 11 | A Review of Thickness Measurements of Thick Transparent Layers Using Optical Interferometry | 박정재,김종안,안흘비,배재석,진종한 | 2019-03-11 | INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING |
| 12 | Physical thickness and group refractive index measurement of individual layers for double-stacked microstructures using spectral-domain interferometry | 박정재,배재석,김종안,진종한 | 2019-01-15 | OPTICS COMMUNICATIONS |
| 13 | A Hybrid Non-destructive Measuring Method of Three-dimensional Profile of Through Silicon Vias for Realization of Smart Devices | 안흘비,배재석,박정재,진종한 | 2018-12-01 | SCIENTIFIC REPORTS |
| 14 | Uncertainty evaluation of thickness and warp of a silicon wafer measured by a spectrally resolved interferometer | A.P. Drija,T. G. Gebr,이재용,강주식 | 2018-05-09 | MEASUREMENT SCIENCE AND TECHNOLOGY |
| 15 | Note: An absolute X-Y-Θ position sensor using a two-dimensional phase-encoded binary scale | 김종안,김재완,강주식,진종한 | 2018-04-12 | REVIEW OF SCIENTIFIC INSTRUMEMTS |
| 16 | Interferometric profile scanning system for measuring large planar mirror surface based on single-interferogram analysis using Fourier transform method | 김종안,김재완,강주식,진종한,엄태봉 | 2018-03-01 | MEASUREMENT |
| 17 | Characterization and application of porous gold nanoparticles as 2-photon luminescence imaging agents: 20-fold brighter than gold nanorods | 박주현,박지수,김수호,김세화,이태걸,이재용,위정섭 | 2018-02-08 | Journal of Biophotonics |
| 18 | Multiplex CARS imaging with spectral notch shaped laser pulses delivered by optical fibers | 오승렬,박주현,김경수,김수현,이재용 | 2017-12-11 | OPTICS EXPRESS |
| 19 | Total physical thickness measurement of a multi-layered wafer using a spectral-domain interferometer with an optical comb | 박정재,배재석,안흘비,진종한 | 2017-05-29 | OPTICS EXPRESS |
| 20 | An interferometric system for measuring thickness of parallel glass plates without 2π ambiguity using phase analysis of quadrature Haidinger fringes | 김종안,김재완,강주식,진종한,이재용 | 2017-05-01 | REVIEW OF SCIENTIFIC INSTRUMEMTS |
| 21 | 300 mm 실리콘 웨이퍼용 고속 관통전극 깊이 계측 장비 개발 | 홍순천,윤석민,우봉주,박정재,진종한 | 2017-05-01 | 한국정밀공학회지 |
| 22 | Time-Resolved Pump?Probe Measurement of Optical Rotatory Dispersion in Chiral Metamaterial | 우제흔,Boyoung Kang,Minji Gwon,Ji Hye Lee,Dong-Wook Kim,William Jo,Dong Ho Kim,Jeong Weon Wu | 2017-04-27 | ADVANCED OPTICAL MATERIALS |
| 23 | 지형 기울기에 의한 항공 수심 라이다 수심 측정 오차 보정 | 심기현,우제흔,이재용,김재완 | 2017-03-09 | 한국정밀공학회지 |
| 24 | Investigation of fiber Bragg grating as a spectral notch shaper for single-pulse coherent anti-Stokes Raman spectroscopy | 오승렬,박주현,김경수,이은성,이재용,김수현 | 2017-01-15 | OPTICS COMMUNICATIONS |
| 25 | Absolute distance measurement method without a non-measurable range and directional ambiguity based on the spectral-domain interferometer using the optical comb of the femtosecond pulse laser | 박정재,진종한,김종안,김재완 | 2016-12-12 | APPLIED PHYSICS LETTERS |
| 26 | Optical Fiber-Based Confocal and Interferometric System for Measuring the Depth and Diameter of Through Silicon Vias | 안흘비,박정재,김종안,진종한 | 2016-12-01 | JOURNAL OF LIGHTWAVE TECHNOLOGY |
| 27 | Report on APMP key comparison: calibration of angle standards | 강주식,엄태봉 | 2016-09-07 | METROLOGIA Tech. Suppl |
| 28 | Structure-charge transfer property relationship in self-assembled discotic liquid-crystalline donor-acceptor dyad and triad thin films | 우제흔,Kwang Jin Lee,Benoit Heinrich,Stephane Mery,Frederic Fages,Loic Mager,Anthony D'Al´eo,Jeong Weon Wu,Fabrice Mathevet,Pascal Andr´,Jean-Charles Ribierre,Yiming Xiao,Eunsun Kim,Leszek Mateusz Mazur,David Kreher,Andr´e-Jean Attias,Katarzyna Matczyszyn,Marek Samoc | 2016-06-06 | RSC ADV |
| 29 | Electronic energy and electron transfer processes in photoexcited donor-acceptor dyad and triad molecular systems based on triphenylene and perylene diimide units | 우제흔,K. J. Lee,E. Kim,A. Barsella,F. Mathevet,L. Mager,J. W. Wu,A. D’Ale´o,J.-C. Ribierre,Y. Xiao,X. Su,L. M. Mazur,A.-J. Attias,F. Fages,O. Cregut | 2016-02-19 | PHYSICAL CHEMISTRY CHEMICAL PHYSICS |
| 30 | Absolute angle measurement using a phase-encoded binary graduated disk | 김종안,김재완,강주식,진종한,엄태봉 | 2016-02-15 | MEASUREMENT |
| 31 | Dimensional metrology using the optical comb of a mode-locked laser | 진종한 | 2016-02-01 | MEASUREMENT SCIENCE AND TECHNOLOGY |
| 32 | Vibration-insensitive measurements of the thickness profile of large glass panels | 박정재,배재석,진종한,김종안,김재완 | 2015-12-14 | OPTICS EXPRESS |
| 33 | High-Speed Double-Slit Interferometer using a Position Sensitive Detector for In-Line Thickness Variation Measurement of Glass Panels | 김종안,김재완,강주식,진종한,엄태봉 | 2015-08-01 | INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING |
| 34 | Ultrahigh-resolution spectral domain optical coherence tomography based on a linear-wavenumber spectrometer | 이상원,강희성,박주현,이태걸,이은성,이재용 | 2015-03-02 | Journal of the Optical Society of Korea |
| 35 | An optical straightness measurement sensor for the KRISS watt balance | 강주식,김종안,진종한,엄태봉,김재완 | 2015-02-02 | MEASUREMENT |
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