EM Nanometrology Team
The EM Nanometrology Team’s goal is to develop electron microscopy-based measuring technologies and their standardization for low-dimensional materials, with a focus on the in-situ and operando nano-characterization. We expect to contribute to the development of key integrated-technologies necessary for emerging future industries.
Current R&D Projects
- 1 Standardization of particle size and membrane thickness measurement
- 2 Development of electron microscopy-based in-situ technique for electro-mechanical property measurement
- 3 Development of in-situ AFM (AFM in SEM technique)
- 4 Operando electron microscopy in liquid environments
Recent R&D Highlights
- Development of a liquid TEM holder for fluid environments that can replace all parts related to liquid flow.
- Development of a technology for manufacturing two-dimensional layered materials with bubble-free clean interfaces
- SEM measurement of thicknesses of MoS2 and multilayered photonic crystal film
Introducing Teams in a Group
About Other Groups
- Atomic Quantum Sensing Group
- Quantum Mass Metrology Group
- Quantum Electricity and Magnetism Metrology Group
- Electromagnetic Wave Metrology Group
- Division of Chemical and Material Metrology
- Gas Metrology Group
- Inorganic Metrology Group
- Division of Biomedical Metrology
- Biometrology Group
- KRISS Academy
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