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Operando Methodology and Measurement Team

The Operando Methodology and Measurement Team develops techniques to analyze the simultaneous correlation between dynamic material properties and device operational performance. This technology will contribute to production of integrated measurement technologies for the characterization and development of next-generation materials for the 4th Industrial Revolution.

Current R&D Projects

• 1 (Material reliability) Evaluation of the operational reliability of optoelectronic materials for solar cells and light emitting diodes
• 2 (Semiconductor physics) Physical and chemical analysis of flexible semiconductor materials for information technology devices.
• 3 (Structural properties) Real time structural analysis for emerging semiconductors

Recent R&D Highlights

• The new organic transistor vertical stacking method that greatly improves the information processing performance compared to the conventional horizontal organic transistor.
• Development of measurement technology for lattice constant and growth direction confinement of single-crystal nickel superalloy at high-temperature (Korea Institute of Materials Science joint research)
• Chemical composition analysis of organic thin film used for OLEDs with depth resolution of 8.3 nm or less

About Other Groups

• Hyperspectral Nano-imaging Team
• EM Nanometrology Team
• Frontier of Extreme Physics Team
• Vacuum Materials Measurement Team
• Intelligent Wave Engineering Team
• Nanobiosensor Team
• Smart Devices Team
• Low-Dimensional Material Team
• Multiscale Mechanical Properties Measurement Team
• IoT Optical Sensor Team
• AI convergence technology development Team