The Optical Imaging Metrology Team develops active/intelligent smart source technology for optical imaging measurement to meet the needs of future industries and the advanced defense industry. The team's goals also encompass the commercialization and demonstration of world-class optical imaging measuring instruments, the establishment of high value-added next-generation measurement standardization, and the dissemination of technology into industries. The team also collaborates with domestic and overseas industry, academic, and research experts from various fields to become a world-leading optical imaging metrology group.
Current R&D Projects
Development of 3D analysis/measurement technology for complex free-form surfaces and nano-devices with multi-layer films
Development of super-resolution/wide-field imaging measurement technology below the diffraction limit.
Development of adaptive optical systems, laser weapon systems, and high-resolution optical imaging equipment
Development of measurement technology and standards for the optical properties of virtual/augmented reality devices
Recent R&D Highlights
- Development of real-time 3D optical measurement technique for internal structure analysis of multilayer thin films (published excellent paper: 2, granted patent: 1)
- Development of optical microscope with wide-field and high-resolution for semiconductor packaging inspection (published excellent paper: 1, technology transfer: 1, patent application: 1)
- Development of measurement standardization technology for optical performance evaluation of VR/AR devices for the first time in Korea (test procedure: 3, patent application: 1)
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